Dual-Sided Position Confirmation Microscope DVM-400NEW
A microscope that superimposes images of both sides of the specimen within the field of view and compares the amount of displacement, which can be measured using a measuring system.
This is a microscope that overlays images of both sides of the specimen within the field of view and compares the amount of displacement for observation, allowing measurement with a measuring system. The objective lenses come in five types, with magnifications ranging from 50x to 1000x, accommodating a wide variety of samples. It features NIR visible/infrared transmission type. There is also a camera position synthesis device available. For more details, please download the catalog or contact us.
- Company：アイティ・テック
- Price：Other
